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Terahertz Characterisation of Lead-Free Dielectrics for Different Applications
Zhang, Man Zhang, Hangfeng Jiang, Qinghui Gao, Feng Chen, Riqing Zhang, Dou Reece, Michael J. Yang, Bin Viola, Giuseppe Yan, Haixue
Zhang, Man
Zhang, Hangfeng
Jiang, Qinghui
Gao, Feng
Chen, Riqing
Zhang, Dou
Reece, Michael J.
Yang, Bin
Viola, Giuseppe
Yan, Haixue
Advisors
Editors
Other Contributors
EPub Date
Publication Date
2021-11-02
Submitted Date
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Adobe PDF, 1.49 MB
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Abstract
In this Spotlight on Applications, we describe our recent progress on the terahertz (THz) characterization of linear and non-linear dielectrics for broadening their applications in different electrical devices. We begin with a discussion on the behavior of dielectrics over a broadband of frequencies and describe the main characteristics of ferroelectrics, as an important category of non-linear dielectrics. We then move on to look at the influence of point defects, porosity and interfaces, including grain boundaries and domain walls, on the dielectric properties at THz frequencies. Based on our studies on linear dielectrics, we show that THz characterization is able to probe the effect of porosities, point defects, shear planes and grain boundaries to improve dielectric properties for telecommunication applications. Further, we demonstrate that THz measurements on relaxor ferroelectrics can be successfully used to study the reversibility of the electric field-induced phase transitions, providing guidance for improving their energy storage efficiency in capacitors. Finally, we show that THz characterization can be used to characterize the effect of domain walls in ferroelectrics. In particular, our studies indicate that the dipoles located within domain walls provide a lower contribution to the permittivity at THz frequencies than the dipoles present in domains. The new findings could help develop a new memory device based on non-destructive reading operations using a THz beam.
Citation
Zhang, M., Zhang, H., Jiang, Q., Gao, F., Chen, R., Zhang, D., Reece, M. J., Yang, B., Viola G., & Yan, H. (2021). Terahertz characterisation of lead-free dielectrics for different applications. ACS Applied Materials & Interfaces, 13, 45, 53492-53503. https://doi.org/10.1021/acsami.1c14583
Publisher
American Chemical Society
Journal
ACS Applied Materials and Interfaces
Research Unit
DOI
10.1021/acsami.1c14583
PubMed ID
PubMed Central ID
Type
Article
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Description
“This document is the Accepted Manuscript version of a Published Work that appeared in final form in [ACS Applied Materials & Interfaces], copyright © American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see [https://pubs.acs.org/doi/10.1021/acsami.1c14583].”
Series/Report no.
ISSN
1944-8244
EISSN
1944-8252