Loading...
Quality-Control of UV offset Lithographicaly Printed Electronic-Ink by THz Technology
Zeng, Yang Donnan, Robert S. Edwards, Marc R. Yang, Bin
Zeng, Yang
Donnan, Robert S.
Edwards, Marc R.
Yang, Bin
Advisors
Editors
Other Contributors
Affiliation
EPub Date
Publication Date
2017-10-16
Submitted Date
Collections
Other Titles
Abstract
In this paper, a novel quality-monitor method of inkjet-printed electronics based on terahertz (THz) sensing is presented. Specifically, two different approaches, namely THz reflection spectroscopy and THz near-field scanning, are proposed.
Citation
Zeng, Y., Donnan, R., Edwards, M., & Yang, B. (2017, 11-13 September). Quality-control of UV offset lithographicaly printed electronic-ink by THz technology. 2017 10th UK-Europe-China Workshop on Millimetre Waves and Terahertz Technologies (UCMMT), Liverpool, UK. https://doi.org/10.1109/UCMMT.2017.8068504
Publisher
IEEE
Journal
Research Unit
DOI
10.1109/UCMMT.2017.8068504
PubMed ID
PubMed Central ID
Type
Article
Language
en
Description
© 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Series/Report no.
ISSN
EISSN
ISBN
9781538627204