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The X-ray photoelectron spectroscopy of surface films formed during the ASTM D-130/ISO 2160 copper corrosion test
Reid, David G. Smith, Graham C.
Reid, David G.
Smith, Graham C.
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2014-01
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Abstract
The surfaces of ISO 2160 copper strips tested in iso-octane with elemental sulfur, aliphatic, cyclic and aromatic thiols, diphenyl sulfide, and diphenyl disulfide individually or in combination were studied using XPS. Aliphatic thiols bonded through the sulfur, whereas elemental sulfur formed a cuprous sulfide layer. Aromatics bonded partially through the sulfur with the rings oriented horizontally due to π orbital interactions, accounting in part for their inhibitory effects in the test. The test rating was not directly related to the sulfur concentration in solution or on the surface, and certain combinations of species resulted in higher levels of sulfur at the surface than found individually.
Citation
Petroleum Science and Technology, 2014, 32(4), pp. 387-394
Publisher
Taylor & Francis
Journal
Petroleum Science and Technology
Research Unit
DOI
10.1080/10916466.2011.588635
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PubMed Central ID
Type
Article
Language
en
Description
This is an Author’s Accepted Manuscript of an article published in Petroleum Science & Technology [Volume 32, Issue 4, 2014 ], available online: http://www.tandfonline.com/10.1080/10916466.2011.588635
Series/Report no.
ISSN
1091-6466
1532-2459
1532-2459